Optical Characterisation of a Three Layer Waveguide Structure by m-Lines Spectroscopy
Résumé
A three layer planar waveguide structure, consisting of a light guiding ferroelectric lead zirconate titanate thin film, embedded between two transparent zinc oxide electrodes, was elaborated and studied by m-lines spectroscopy. The three layer modal dispersion equations are established and we demonstrate experimentally the ability to retrieve the refraction index and the thickness of each individual layer of the composite waveguide from one single m-lines spectroscopy measurement.
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