Optical Characterisation of a Three Layer Waveguide Structure by m-Lines Spectroscopy

Thomas Schneider , Dominique Leduc (1) , Julien Cardin (2) , Cyril Lupi (1) , Hartmut Gundel (3)

1 GeM - Institut de Recherche en Génie Civil et Mécanique
2 CIMAP - UMR 6252 - Centre de recherche sur les Ions, les MAtériaux et la Photonique
3 IETR - Institut d'Électronique et des Technologies du numéRique

A three layer planar waveguide structure, consisting of a light guiding ferroelectric lead zirconate titanate thin film, embedded between two transparent zinc oxide electrodes, was elaborated and studied by m-lines spectroscopy. The three layer modal dispersion equations are established and we demonstrate experimentally the ability to retrieve the refraction index and the thickness of each individual layer of the composite waveguide from one single m-lines spectroscopy measurement.

Mots clés: M-lines spectroscopy; composite waveguide; PZT; ZnO; thin film

Domaines: Science des matériaux [cond-mat.mtrl-sci]; Optique / photonique

Thomas Schneider, Dominique Leduc, Julien Cardin, Cyril Lupi, Hartmut Gundel. Optical Characterisation of a Three Layer Waveguide Structure by m-Lines Spectroscopy. Ferroelectrics, 2007, 352 (1), pp.50 - 60. ⟨10.1016/j.surfcoat.2003.11.014⟩. ⟨hal-01494638⟩